BERLIN, Germany, May 23, 2013 VI Systems GmbH, a leader in ultra-high speed components for data communications, published in cooperation with partners the reliability study of the V25-850C4 chips (4x1 arrays of vertical-cavity surface-emitting lasers). The paper is published in Semiconductor Science and Technology (vol 28, no 6) and reports on failure-free operation of the chips for above 6000 hours at 95oC heat sink temperature at 5 mA drive current (with a current density of 18 kA/cm2). No degradation of the output power at the same current with time was observed.

Error-free operation at 25 Gb/s at 5mA is demonstrated in a broad temperature range at a small penalty in the received power (~1dB, 85oC, as compared to room temperature).

The degradation study and the related data acquisition have been performed by EZconn a.s., a part of eGtran Corporation. Further partners are Connector Optics LLC, A.F. Ioffe Physical-Technical Institute and the Technical University of Berlin.

The paper can be freely downloaded within one months after the publication date at http://iopscience.iop.org/0268-1242/28/6/065010